- Title
- Frequency domain analysis of robust demodulators for high-speed atomic force microscopy
- Creator
- Ruppert, Michael G.; Harcombe, David M.; Ragazzon, Michael R. P.; Moheimani, S. O. Reza; Fleming, Andrew J.
- Relation
- 2017 American Control Conference (ACC). Proceedings of the 2017 American Control Conference (ACC) (Seattle, WA 24-26 May, 2017) p. 1562-1567
- Publisher Link
- http://dx.doi.org/10.23919/ACC.2017.7963175
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Resource Type
- conference paper
- Date
- 2017
- Description
- A fundamental but often overlooked component in the z-axis feedback loop of the atomic force microscope (AFM) operated in dynamic mode is the demodulator. Its purpose is to obtain a preferably fast and low-noise estimate of amplitude and phase of the cantilever deflection signal in the presence of sensor noise and additional distinct frequency components. In this paper, we implement both traditional and recently developed robust methods on a LabVIEW digital processing system for high-bandwidth demodulation. The techniques are rigorously compared experimentally in terms of measurement bandwidth, implementation complexity and robustness to noise. We conclude with showing high-speed tapping-mode AFM images in constant height, highlighting the significance of an adequate demodulator bandwidth.
- Subject
- bandwidth; demodulation; robustness; frequency measurement; Kalman filters; standards; tuning
- Identifier
- http://hdl.handle.net/1959.13/1348360
- Identifier
- uon:30196
- Identifier
- ISBN:9781509059928
- Rights
- © 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
- Language
- eng
- Full Text
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